This 2-hour tutorial will explore scanning white light interferometry (SWLI) which is one of the most widely implemented measurement techniques for the rapid non-contact acquisition of areal topography data from both rough and smooth surfaces. The tutorial will cover some of the basic physics related to signal formation in SWLI instruments, describe the basic operating principles and discuss some of the pro and cons of the technique in relation to other common types of commercial instrumentation use for the same purpose. A live practical demonstration using a custom-made optical apparatus on an optical breadboard will give attendees the opportunity to explore what is ‘under the hood’ of commercial grade instruments. There will be an opportunity to get ‘hands-on’ with the alignment procedures necessary to obtain a measurement, as well as the chance to explore signal processing approaches required to generate useable topographic data from raw interferograms.

Target Audience: The tutorial is open to everyone, including graduate and postgraduate engineers/physicists, post-doctoral researchers, and scientific managers. A basic knowledge of metrology will be beneficial

This is a beginner to intermediate level course, with material ranging from basic to advanced, to provide both an overview and references for further studies.

Expected Outcomes: Participants will acquire knowledge in scanning white light interferometry (SWLI).

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