26th International Conference & Exhibition
8th – 12th June 2026, Krakow, Poland

Euspen’s 26th International Conference & Exhibition is held over 5 days (8th – 12th June 2026) and the daily programme is detailed below.

The conference and exhibition is being inside the Hotel Premier, Krakow. The tutorials and workshops will be held inside the University of Krakow.

Company and Laboratory tours will be held on Friday 12th June 2026

Monday 8th June 2026

TimeProgramme
08:30 – 17:00Tutorial One: Passive Damping in Mechatronics Systems by means of Polymers-
Pieter Wullms, MI-Partners, NL
Location: University of Krakow
09:00 – 12:00Tutorial Two: Dimensional metrology based on ultrashort pulse lasers and optical frequency combs
Prof Gao, Tohoku University
Location: University of Krakow
14:00-17:00Workshop One: Application of Digital-Metrological Twins for emerging measurement technology in advanced manufacturing
Dr. Walter Knulst, VSL (ADAM’s WP1 leader) and Guido Tosello, PhD Associate Professor, Head of Studies Materials and Manufacturing Engineering, Technical University of Denmark
Location: University of Krakow
14:00-17:00Workshop Two: Robotics For Medical Applications and Scientific Exploration
Prof. Andreas Archenti, KTH, SE, Associate Prof. Toru Kisaki, University of Tokyo, JP and Assistant Prof. Saul Heredia also from University of Tokyo, JP
Location: University of Krakow
14:00-16:00Early Registration
18:30-20:30Welcome Reception

Tuesday 9th June 2026

TimeProgramme
08:00Conference Registration at Hotel Premier, Krakow
09:00 – 09:10Presidential Address: Prof. Andreas Archenti, KTH, SE
09:10 – 09:20Welcome to Krakow, Rector of Cracow University of Technology, Prof. Andrzej Szarata
Keynotes introduced by: Prof. Adam Gaska
09:30 – 10:00Keynote One: Machine Tool Metrology, Industrial CT
Prof. Adam Woźniak, Warsaw University of Technology, Poland
10:00- 10:30Keynote Two: Aperture Calibration at 0 °C: Metrological Challenges Beyond Established Standards
Prof. Dr.-Ing Michael Marxer, Eastern Switzerland University of Applied Sciences, Institute for Microtechnology and Photonics, Competence Centre for Production Metrology
10:30- 11:00Coffee in Exhibition
11:00-13:00Oral Session One: Metrology

CHAIRS: tbc

Session Keynote: 11:00-11:20 Development of a compact gear measuring machine based on modified line-of-action scanning for high-precision tooth profile measurement. Yohan Kondo, National Institute of Advanced Industrial Science and Technology ICE26184

11:20-11:35 Investigating filter end-effects on profiles having form, in the context of ISO 21920. François Blateyron, Digital Surf ICE26113

11:35-11:50 Enhanced In-Situ Focus Variation Surface Metrology via Pattern-Projected Illumination for Highly Polished Electrochemical Surfaces. Hussam Muhamedsalih, University of Huddersfield ICE26260

11:50-12:05 Ultra-compact metalens-based phase shifting interferometry for surface metrology. Dawei Tang, University of Huddersfield ICE26258

12:05-12:20 Modeling of coordinate measurement uncertainty using an expert system with machine learning elements. Danuta Owczarek, Laboratory of Cooridnate Metrology, Cracow University of Technology ICE26200

Industry Presentations – Chair:

12:20-12:23
12:23-12:26
12:26-12:29
12:29-12:32


12:35-13:00 Discussion

(Early exhibitor’s lunch 12:30-13:00)

13:00- 14:00Lunch and Coffee in Exhibition
14:00-15:45Oral Session Two: Measuring Instruments & Machine Tools

CHAIRS: A. Archenti; P. Dunaj

 Session Keynote:

14:00-14:20 Aerostatic journal bearing as a capacitive sensor for runout measurement. Petteri Haverinen, Aalto University ICE26120

14:20-14:35 Error propagation in two-axis feed drives using physical error injection and a multibody simulation. Pu Sun, KTH Royal Institute of Technology ICE26158

14:35-14:50 Telecentric under-surface imaging system for in-situ observation of polishing pad-glass contact. Adam Wilczek, Hochschule Aalen ICE26165

14:50-15:05 Autocollimation and Reflected-Power Optimization in High-Refractive-Index Glass Retroreflectors for Robust, Cost-Effective Systems. Mateusz Sosin, CERN ICE26201

15:05-15:20 Development of a Critical Assembly Quality Analysis Method for Machine Tools Based on the Jacobian-Torsor Model. Lin Tsao, Center for Measurement Standards, Industrial Technology Research Institute ICE26254

15:20-15:45 Discussion

15:45-16:10Coffee in Exhibition
16:10-18:00 Oral Session Three: Precision Manufacturing Processes
CHAIRS: O. Riemer, S. Gasparin

16:10-16:25 Monocular Vision for Online Feedback Control in Volumetric 3D Printing. Yu Liu, School of Mechanical Engineering, Jiangnan University ICE26253

16:25-16:40 Micro structuring of cutting punches for tribological optimization of stamping processes. Jan Edelmann, Fraunhofer IWU ICE26152

16:40-16:55 Recycled Walnut Shell Abrasives as a Sustainable Feedstock for Binder Jetting. Luwen Zhang, Technische Universität Bergakademie Freiberg ICE26132

16:55-17:05 Automated algorithm for the evaluating of burr formation in micro milling. Maximilian Vierling, RPTU Kaiserslautern, Institute for Manufacturing Technology and Production Systems ICE26109

17:05-17:20 Development of an innovative process chain to enhance the durability of functionalized polymer surfaces for real-world applications. Giacomo Baruffa, University of Padova ICE26136 

Industry Presentations – Chair:

17:20-17:23
17:23-17:26
17:26-17:29
17:29-17:31
17:31-17:34

17:35-18:00 Discussion

18:00CLOSE
19:30-22:30Presidents Dinner

19:00 Transport to restaurant
19:30 Restaurant
22:30 Transport back to Hotel Premier

FREE EVENING

Wednesday 10th June 2026

TimeProgramme
Keynote introduced by: Liam Blunt
08:30 –

09:00

Keynote Three: Prof. Dr Julian Polte, Fraunhofer IPK, TU Berlin
09:00-10:45Oral Session 4: Advances in Precision Engineering
CHAIRS: L. Blunt,Session Keynote: 09:00-09:20 Design of Test Setup for Measurement of Microslip in Clamped Interfaces using a Balanced Heterodyne Interferometer with Picometer-Resolution. Walter Knulst, VSL ICE262160

9:20-09:35 Finite element framework for coupled Reynolds–Darcy flow in air bearings. Jalmari Lee, Aalto University ICE26229

09:35-09:50 Challenges in the design of force sensors based on the structure of high-precision weighing cells. Lennart Frentzel, Technische Universität Ilmenau ICE26245

Industry Presentations
09:50-09:53
09:53-09:56
09:56-09:59
09:59-10:02
10:02-10:05

10:05-10:20 Discussion 

10:20 – 10:50Coffee in Exhibition
Oral Session 4: Advances in Precision Engineering (cont.,)
CHAIRS: L. Blunt,


10
:50-11:05 Data-Driven Framework for Machine Learning-Based Uncertainty Quantification in Coordinate Measuring Machines. Alireza Mollaei Ardestani, Technical University of Denmark (DTU) ICE26193

11:05-11:20 The Satisloh Plasma Polisher: the science, technology development, and commercialisation of atmospheric pressure surface figuring for ultra-precision optics. Adam Bennett, Cranfield Plasma Solutions ICE26179 

Industry Presentations
11:20-11:23
11:23-11:26
11:26-11:29
11:29-11:32

11:35-11:45 Discussion

11:50 – 12:00Heidenhain Scholarships Ceremony
12:00– 12:10Announcement of our euspen 27th International Conference & Exhibition Prof. Raine Vitali, Aalto University, Finland
12:10 – 12:25euspen AGM, in plenary (for members only)
12:10 –   13:00Poster viewing and networking
13:00 – 14:00Lunch and Coffee in Exhibition

Lunch available for exhibitors at 12:30 -13:00

 

14:00 – 15:45


Oral Session 5: Large Scale Precision Engineering and Metrology
CHAIRS: M. Sitek, H. Urreta

Session Keynote: 14:00-14:20 Development of high pressure and high temperature injection modules for 4D µCT in synchrotron environment. Cassiano Bueno, Brazilian Synchrotron Light Laboratory (LNLS) ICE26246 

14:20-14:35 Dense Data Fusion and Uncertainty Quantification in Optical Metrology: The Duster++ Framework. Ladji Fofana, LNE ICE26181

14:35-14:50 Internal Quality Optimisation of Material Extrusion Additive Manufacturing via Computer Vision-Enhanced Layerwise Surface Topography Measurement. Kexin Yin, University of Huddersfield ICE26261

14:50-15:05 Initial Verification of a Next Generation g-Ray Spectrometer Key Performance Parameters: Gamma-Ray Energy Tracking Array. Eric Buice, Lawrence Berkeley National Laboratory ICE26198

15:05-15:20 Nanomotion for ALBA II: laboratory, metrology and control for precision engineering. Juan Luis Frieiro Castro, ALBA Synchrotron Light Source ICE26174

15:20 -15:45 Discussion

15:45 – 16:15Coffee in Exhibition
16:15 –18:30Poster Session
17:45 –18:30Exhibitor Drinks sponsored by Professional Instruments
18:30
19:00
Coaches to dinner

euspen Networking Dinner (Coaches to dinner)

Thursday 11th June 2026

TimeProgramme
09:30 – 10:50

 

 

Oral Session 6:  Applications of Precision Engineering in Bio-Tech Devices

Chairs: G. Tosello &

09:00-09:15 Ultra-precision machining of superhydrophobic surfaces with re-entrant microstructures. Douwei Liu, University of Huddersfield ICE26221

09:15-09:30 Automated Multi-Balloon Drug-Coating System with Configurable Process Parameters. Yixue Wang, Fraunhofer IPK ICE26231

09:30-09:45 Modular child lower limb phantom with seven degrees of freedom simulating micrometric bone growth. Krzysztof Popielski, Warsaw University of Technology ICE26217

09:45-10:00 Functional tools micro-texturing for controlled chip formation in precision dry machining of PEEK. Anna Bottin ICE26238

10:00- 10:20 Discussion

10:20- 10:45Coffee in Exhibition
10:50 – 12:30Poster Session

Voting on posters will close at 12:15

Winners announced by Liam Blunt in poster area

12:30 – 13:30Lunch and Coffee in Exhibition

Lunch available for exhibitors at 12:00-12:30

13:45 14:50 Oral Session 7: Mechatronics and Control

CHAIRS: D. Reynaerts & T. Ruijl

13:30-13:45 A dynamics toolbox for modelling and prediction of interconnected systems. Henny Spaan, IBS Precision Engineering ICE26262

13:45-14:00 Investigation of Motor Characteristic Analysis under Low Magnetic Field Conditions in Planar Maglev Stages. Takanori Kato ICE26215

14:00-14:15  Performance of an X-Y-Theta actuator using piezoelectric elements and electropermanent magnets’ – Akihiro Torii , Aichi Institute of Technology ICE26153

14:15-14:30 Measuring the future – Nanometrology for advanced manufacturing of miniaturized devices. Agnieszka Jastrzębska, Warsaw University of Technology ICE26214

 14:30-14:50 Discussion

14:50-15:15Closing Remarks- euspen Vice President, Prof. Jose A. Yague-Fabra, University of Zaragoza, ES
 FREE EVENING