Keynote

|Keynote

Traceability in manufacturing metrology: do we still need artefacts?

https://www.euspen.eu/wp-content/uploads/2020/06/Prof-Simone-Carmignato-v3.mp4

Advanced Robotics and AI in “Demanding” Industrial, and Manufacturing Environments

https://www.euspen.eu/wp-content/uploads/2020/06/euspen-KN-2020-Prof.-Caldwell.webm

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